Supply Current Monitoring for Testing CMOS Analog Circuits
Iluminada Baturone, J.L. Huertas, Santiago Sánchez-Solano, Andrew Michael Richardson · Lancaster EPrints (Lancaster University) · 1996
This paper explores the applicability of I_ddq testing to the field of analog circuits. An attempt is made to categorise different analog design styles according to their potential current testability and some representative circuits are analysed. Considerations at a transistor and block level are given as a first step to understand the limitations of extending this technique to more complex designs.