Embedded Processor Based Built-In Self-Test and Diagnosis of Logic and Memory Resources in FPGAs.
Daniel T. Milton, Sachin Dhingra, Charles E. Stroud · 2006
Abstract – We present an embedded processor based approach for Built-In Self-Test (BIST) and diagnosis of programmable logic and memory resources in Field Programmable Gate Arrays (FPGAs). The resources under test include the programmable logic blocks (PLBs), large random access memories (RAMs), and digital signal processors (DSPs) in all of their modes of operation. The approach is applicable to any FPGA that supports dynamic partial reconfiguration via an embedded processor core. As a case study, we present the application to test and diagnose logic and memory resources in the Xilinx Virtex-4 series FPGA. We also exploit architectural features to enhance dynamic partial reconfiguration for BIST to reduce the amount of program memory storage for the embedded processor core as well as the total time required for BIST. 1 1.