2001 6th International Workshop on Statistical Methodology : IWSM, June 10, 2001, Kyoto
応用物理学会, 電子情報通信学会 · Institute of Electrical and Electronics Engineers eBooks · 2001
The proceedings of the 6th International Workshop on Statistical Metrology, held in 2001. The papers cover: yield ramping methodology; metrology for statistical process control; sensor and measurement technology; spatial and temporal variation analysis methods; robust design; and more.