Switch-Level Test Generation of Competing Bridging Faults in the Presence of Feedback
Kristian Wiklund, Tomas Magnusson, Peter Dahlgren · 1998
This paper presents an efficient scheme to improve the test generation of voltage testing under the competing bridge fault model. A procedure is presented that extracts test generation objectives from switch-level networks, which will maximize the likelihood of detecting a bridging fault that is undetectable by a stuck-at test set. The effects of both active feedback and variations in transistor parameters are taken into account. The experimental results show that the proposed method generates a significant increase in fault coverage at a relatively low computational cost.