Techniques for improved diagnosis
Spyros Tragoudas, Rajsekhar Adapa · 2008
Fault diagnosis is an essential part in the test cycle of an integrated circuit design. Efficient diagnosis improves the reliability of the chip, increases the production yield, and reduces the time to market. This dissertation presents three different solutions to improve fault diagnosis. The proposed techniques reduce the effort in diagnosing the source of failure by reducing the number faults considered during diagnosis, by generating additional tests which are capable of pruning faults that cannot correlate the failure in design and by prioritizing faults for diagnosis. Experimental results demonstrate the effectiveness of the proposed techniques.