Algorithms for Testing Boundary-Scan Equipped Circuits
Stephen Leslie Peters · 1999
Boundary-scan components are a relatively new development in the field of circuit board testing, yet their ability to test chips in isolation and to record the state of an entire printed circuit board indicate their potential for long-term application in the electronics industry. However, algorithms which can e#ciently utilize this hardware, especially on printed circuit boards that have few boundary-scan components, have yet to be developed. In this thesis, several algorithms have been designed and analyzed, and either code samples (in C ) or pseudocode have been provided for each. In the final chapter, the algorithms are compared to choose the "best" among the developed algorithms.