Test generation complexity for stuck-at and path delay faults based on tau[k] - notation
Chia Yee Ooi, Thomas Clouqueur, Hideo Fujiwara · Institutional Repositories DataBase (IRDB) · 2005
This papcr introduces Tk-notation to be used to analyze the test generation complexity of a class of circuits with a type offaults. In this paper, we discuss classes of sequential circuits and combinational circuits with stuck-at and path delay faults, which are representative faults in logical and timing faults respectively. Using Tk-notation, we reconsider the test generation complexity for acyclic sequential circuits with stuck-at faults. We also analyze the test gencration complexity for combinational circuits and acyclic sequential circuits with robust and non-robust path delay faults. On the other hand, we define easily testable classes of cyclic sequential circuits in the aspects of the number of time frames and running ttime taken by the state justification and differentiation, and also the state validity for both cases of stuck-at faults and path delay faults. We also introduce two classes of cyclic sequential circuits, namely two-column state-shiftable finite state machine realizations with observable shifting logic (2COS-SSFSM) and two-column distributive state-shiftable finite state machine realizations (2CD-SSFSM). Then, we discuss the test generation complexity for these two classes with stuck-at and path delay faults. The application based on the classification of sequential circuits is two-fold. Firstly, we can apply the test generation method for combinational circuits with stuck-at faults, which is more efficient in order to solve the test generation for each class with a type of faults. Secondly, a design for testability (DFT) or a synthesis for testability (SFT) method can be introduced based on the properties defined for each class of sequential circuits. Besides clarifying the test generation complexity, we also compare the test generation complexity for different classes of circuits with different type of faults.