Test Time Minimization for Hybrid BIST with Test Pattern Broadcasting
Raimund Ubar, Maksim Jenihhin, Gert Jervan, Zebo Peng · 2003
This paper describes a hybrid BIST architecture for testing core-based systems together with a method for test time minimization. The approach uses test pattern broadcasting for both pseudorandom and deterministic patterns. To overcome the high complexity of the test time minimization problem we propose a fast algorithm to find an efficient combination of pseudorandom and deterministic test sets under given memory constraints. The efficiency of the approach is demonstrated by experimental results.