Tutorial test generation for VLSI chips
Vishwani D. Agrawal, Sharad C. Seth · IEEE Computer Society Press , Order from IEEE Computer Society eBooks · 1988
Reprints of papers taken from 18 different journals, published between 1967 and 1987. They give a comprehensive overview of very large-scale integration testing. No significant prior experience in testing is assumed. Concepts and current practices are emphasized. Chapters are preceded by a tutorial.