Fault detection test generation at the register transfer design level
C.H. Chiang, F.J. Hill, Amir Mohseni, D.P. Chen · OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) · 1982
The authors describe the continuing development of a program capable of automatic generation of sequences of inputs for detection of faults in VLSI digital networks. The only description of a digital system required by the program is written in the hardware description language, AHPL (a hardware programming language). Together with a function level simulator and a hardware compiler the test generation program called SCIRTSS (sequential circuit test search system) form the front end of a design automation process. 10 references.