Test Stimulus Generation for Steady-State Analysis of Analogue and Mixed-signal Circuits
C.D. Chalk, Mark Zwoliński, B.R. Wilkins · ePrints Soton (University of Southampton) · 1997
The technique of monitoring the RMS value of the AC component of the supply current of an analogue integrated circuit has been shown to be very effective at detecting hard faults. A suitable input stimulus must be derived but this has been done by trial and error. In this paper we present a novel algorithm for deriving suitable stimuli for particular faults.