Automatic Measurement System for Evaluating HPM Pulse Effect on Low-Noise Amplifiers
Haoyi Guo, Zongqi Cai, Qifeng Huang, Wenxiao Fang · 2025
High-power microwave(HPM) pulse measurement plays a critical role in the study of HPM effects and is essential for assessing the reliability of RF front-end products. This paper presents the design of an automated HPM measurement system, which incorporates two operational modes based on the damage mechanism of the device under test (DUT). The system enables real-time monitoring and characterization of direct current (DC) and radio frequency (RF) in both the time and frequency domains. Additionally, a database is established to record the degradation of the DUT's electrical parameters. Application tests indicate that the system can provide valuable data support for the study of electronic product reliability and electromagnetic protection technology.