New Method for Generating Test Codes to Detect Multiple Stuck-at-Faults in Combinational Circuits. Part 2
Bohdan Ye. Rytsar · Information Technologies and Systems (Інформаційні технології та системи) · 2025
The article is devoted to a new method of generating test codes to detect multiple stuck-at-faults (0/1) type damages in digital combinational PIPO-circuits, which is based on the artificial introduction of non-essential variables and the application of the procedure of q-partition of the system minterms of a given system of functions. Due to the use of the numerical set-theoretic approach, the proposed method differs from the known ones in a relatively simpler practical implementation to detect stuck-at-faults (0/1) type damages both at one point and simultaneously at several points simultaneously of the studied circuit.