Testing of multi-output combinational circuits when reactions on test patterns are known
Anzhela Yu. Matrosova, Marina M. Savenkova, Viktor A. Provkin, Ksenia A. Sukhoruchenko · Vestnik Tomskogo gosudarstvennogo universiteta Upravlenie vychislitel naya tekhnika i informatika · 2024
Deriving test sequences for multi-output combinational circuits is usually connected with applying test patterns on input circuit variables, so that the reaction on each test pattern differs at least by one output from correct one. Finding the suitable reactions on test input patterns may be used when deriving test sequences is oriented to cut power dissipation or to facilitate finding the circuit faults. The precise algorithm of deriving all input test patterns together with their reactions that differs fault and fault free circuits is suggested. It is based on applying operations on ROBDDs depending on only input circuit variables, only output circuit variables and both input and output circuit variables. Some possibilities of using input test patterns together with their reactions for debugging are discussed.