Addressing the Cross-Temperature Issue in 3-D NAND Flash Memories: Characterization and Mitigation for Solid-State Drives
Cristian Zambelli, Rino Micheloni · IEEE Design and Test · 2025
THE 3D NAND Flash technology is the primary storage medium within Solid State Drives (SSDs) [1]. Its scalability demonstrated numerous advantages in terms of storage density compared to traditional planar NAND [2]. The reliability assessment of this storage medium primarily considers endurance, retention, and disturb immunity at various operating temperatures [3].