P‐28: Advanced Image Comparison Metric for Discerning Subtle Distinctions in Visual Quality
Tamoghna Ghosh, Susanta Bhattacharjee, Neelanjan Bhattacharyya, Vicky Bisen, Mukesh Arora, Vishal Sinha, Kunjal Parikh · SID Symposium Digest of Technical Papers · 2025
Traditional image quality evaluation methods often fail to detect subtle differences crucial for high‐stakes applications. Until now, discerning these minute variations has largely been a manual endeavour that is expensive, time‐consuming, and lacks repeatability, while existing algorithms like PSNR, SSIM, LPIPS, and FID lack sensitivity. This paper introduces three advancements: effective use of existing metrics for subtle comparisons, a new no‐reference metric for detecting fine artifacts, and a novel methodology for detailed image comparison. Using image super‐resolution (SR) as a case study, our method captures critical nuances missed by previous analyses.