Fast and Accurate Jitter Amplification Modeling With Variable Pulse Width Response for Statistical BER Analysis in Chiplet Interconnects and Beyond
Shenggao Li, Maher Amer · IEEE Journal on Emerging and Selected Topics in Circuits and Systems · 2025
In this paper, we investigate Statistical Bit Error Rate (BER) analysis for low-loss short-reach chiplet interface and high-loss long-reach serial interface. We used jitter filtering to account for the residue jitter not tracked by a forwarded clock system and proposed a fast and exact Statistical BER method to account for the Tx jitter amplification effect in a high-loss channel. Our proposed method achieves a linear computation complexity.