Reliability Characterizations on the Hybrid Hot-Cold Data Conversion in 3D NAND Flash Memory Under Various Temperatures
Yi Ding, Ruidong Li, Yining Zhou, Xinghao Wang, Peng Guo, Yixuan Fan, Pengpeng Sang, Jixuan Wu, Xuepeng Zhan, Jiezhi Chen · 2025
In this work, the reliability of Hot-Cold data conversion in 3D NAND Flash is evaluated by analyzing the Raw Bit Error Rate (RBER) under different temperatures. The conversion is achieved through read operations at varying frequencies, in which the RBER drops as the frequency increases. Our findings indicates the frequent read operations can enhance the storage reliability of cold data, which may provide potential insights to increase the lifetime of NAND flash memory.