Lazy Discharge: A High- Speed Energy-Efficient Read Technique for NAND Flash Memory
Hyeunjoo Kim, Sanghun Oh, Jaeyong Lee, Jihong Kim · IEEE Design and Test · 2025
As NAND flash memory continues scaling to higher-layer architectures, increasing wordline and bitline capacitances present critical challenges in terms of read latency and power consumption. Conventional read operations enforce precharge, evaluation, and discharge cycles for every access, even when successive reads target the same block, leading to unnecessary latency/energy overhead. In this paper, we propose a novel read-optimization scheme that reuses residual charge from prior reads, effectively bypassing redundant precharge and discharge steps. Our approach reduces overall read latency by 29% and energy consumption by 28%.