Enhanced Fault Detection for FPGA-based Elliptic Curve Cryptography
G. S. Kiruthika, M.S. Udhaya, Annam Swetha, Bojanki Priyanka · Journal of Electronics and Informatics · 2025
For secure communications in particular, elliptic curve cryptography relies heavily on Elliptic Curve Scalar Multiplication (ECSM). The window approach is perfect for FPGA-based solutions since it increases ECSM efficiency. Verifying the accuracy of calculations made by hardware or software is essential to spotting possible mistakes. In this study, we introduce new defect detection strategies for scalar multiplication using the window method, which has not been studied in detail. Our strategy entails creating intricate algorithms and implementations to successfully minimize both transient and permanent faults. We validate our method's correctness by simulating a failure model, proving its dependability and broad error coverage in our assessments.