Design of Reliability Assessment Scheme for Secondary Equipment in Substations
Yao Zhiqiang, Fan Chen, Hui Jun Ren, Tongwei Yu, Zhang Haidong, Xin Xu · 2025
This paper proposes a new reliability assessment method based on chip-level monitoring data. Traditional reliability assessment methods primarily rely on historical data statistics and generic failure rates of electronic components, facing challenges such as difficulty in obtaining reliability data, long testing periods, high costs, and insufficient accuracy due to assumptions. This study starts with chip-level monitoring and establishes a chip operation data acquisition system for secondary equipment in substations on a wide-area scale. By utilizing real-time operational data and combining it with failure data from equipment type tests, a failure threshold calculation method and scoring evaluation system are developed. This enables precise reliability assessment of secondary equipment in substations, providing a scientific basis for improving equipment reliability and optimizing operating conditions.