A Modified Technique for the Detection and Exact Localization of Missing Gate Faults in Reversible Circuits
Bappaditya Mondal, Subrata Datta, Sutapa Sarkar · IETE Journal of Research · 2025
The main challenge in the field of reversible circuit testing is to diagnose the detected fault in the circuit. The proper diagnosis of the circuit is dependent on the computation of the exact location of the fault. Considering the facts in this article, an approach is proposed for fault detection and the exact localization of the detected fault for the different missing gate fault models in reversible circuits. In the proposed article, a basic algorithm has been discussed for the detection and localization of faults such as single missing gate fault (SMGF), partial missing gate faults (PMGF), and multiple missing gate faults (MMGF). The basic algorithm detects and localizes faults efficiently in the circuit. A modified algorithm over the basic algorithm has also been introduced for the efficient and faster detection and localization of faults in reversible circuits. The modified algorithm has been tested over different benchmark circuits, and it has been observed that the modified algorithm has performed better than the basic algorithm. The testing overhead and the complexity of the modified algorithm are reduced in a significant way and the execution time is also reduced by 40%.