FPGA-Based Test Platform for 56-Gbps NRZ Digital ICs and Systems
David C. Keezer, Cao Wang · 2025
This presentation briefly reviews the development of high-speed digital Automated Test Equipment (ATE) that exhibits an exponential performance growth trend which has persisted through several decades. Recent work is presented that leverages 14-28-Gbps FPGAs to extend usable test rates to 56 Gbps. This work leads to a planned development for extending beyond 100 Gbps.