Metrological Traceability for the Impedance of Coaxial Devices Using an LCR Meter
James Skinner, Murat Celep, Stephen Protheroe, Nick Fletcher, Nick Ridler · IEEE Transactions on Instrumentation and Measurement · 2025
In this paper, capability for traceable impedance measurements of Type-N coaxial devices implemented using an LCR meter is presented. An LCR meter, operating at frequencies between 1 kHz and 1 MHz, was fitted with a 4-terminal pair to coaxial adapter to interface with Type-N devices. An error model for calibrating the LCR meter and steps to characterize the Short-and Open-circuit calibration standards are detailed. To verify the measurement system, measurements were compared with VNA techniques. Finally, the measured impedance of a well-matched 50 Ω Type-N power sensor was converted to linear reflection coefficient, and an uncertainty for linear magnitude in the region of 0.2 mU (milli-units)(k= 2) is reported. This capability has the potential to provide measurements of reflection coefficient of devices in coaxial line with very low uncertainties.