A Novel Temperature Resilient Mixed Signal PUF based on Current Starved Inverter for Digital Authentication
Nitish Kumar, Kavindra Kandpal, Manish Goswami · 2024
In modern semiconductor technology, Physically Un-clonable Functions (PUFs) use production variations to enhance security with minimal resources. They are cost-effective and resistant to attacks, making them ideal for Challenge-response authentication and key generation in embedded devices. This paper introduces a novel PUF design using the Current Starved Inverter (CSI) to leverage process variations for unique challenge-response pairs. Simulations with a 180 nm CMOS technology node showed 49.5% uniformity, 49% average bit-aliasing, and a 50% inter-hamming distance. The PUF's reliability improved to 98.08%, with each response bit consuming 1.2 mW. The Monte Carlo simulation shows the Gaussian curve with a mean of 0.24 and SD of 1.12. The corner analysis is performed at all corners and shows efficiency across a wide temperature range of -40°C to 120°C.