SC-DSB signal as a probe signal for testing nonlinearity in electronic circuits
Naira Gasparyan, Arsen A. Hakhoumian, Eduard Sivolenko, Manuk G. Barseghyan · IET conference proceedings. · 2025
In today's technological landscape, there is a growing reliance on wireless devices for a wide range of applications, spannin g from data networks to wireless sensors. In order to identify and analyze these wireless devices, it is crucial to conduct thorough surveys of the surrounding environment. However, this task becomes challenging when it comes to characterizing the properties of the RF circuit. When a two-dimensional signal is transmitted to an RF device, it is impacted by the nonlinear components of the circuit, such as amplifiers and diodes. These nonlinear components give rise to intermodulation distortion of the input signal, which is then re-radiated by the device [1]. The characteristics of the intermodulation distortion result are harnessed to construct a unique fingerprint of the device [1]. This fingerprint is subsequently utilized to effectively characterize the device, enabling its identification among other RF devices.