A High-Performance and High-Robustness Triple-Node-Upset Tolerant Latch Based on Redundant-Node Hardening
Qiang Zhao, Qingyi Liu, Xinyi Zhang, Licai Hao, Xin Li, Shengyue Zhang, Chunyu Peng, Zhiting Lin, Xiulong Wu · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2025
In response to the issues of high cost, large overhead, and limited node fault tolerance in current latch hardening techniques, this article proposes a latch circuit resistant to triple-node-upset (TNU) based on redundant-node hardening technology. This latch comprises eight 1P2N modules interlocked, with its output isolated by two levels of C-elements (CEs), achieving tolerance to TNU. The performance of the redundant-node reinforcement TNU tolerant latch (RNRTTL) was simulated and verified using CMOS 65 nm technology. The simulation results indicate that the RNRTTL circuit has a D-Q delay of 14.14 ps, static power consumption of$4.03~\mu $w, an area of$32.87~\mu $m2, and an area-static power-D–Q delay-product (APDP) of 1873, respectively. Compared to the triple-node upset tolerant latches TTLL, TNU-latch, TNURL, and HLTNURL reported in the current literature, the proposed latch demonstrates an average reduction of 219.9%, 164.9%, 150.7%, and 2464.8% in D-Q delay, static power consumption, area, and APDP, respectively, indicating that the RNRTTL latch has superior comprehensive performance; furthermore, a series of 2000 Monte Carlo (MC) simulations on the node group$\langle $Q, X0, X$8\rangle $reveal that the proposed latch circuit possesses good stability, making it suitable for harsh radiation environments.