Module and Crate Subsystem Test Hardware Configuration: HN 102
USDOE Office of Science (SC), High Energy Physics (HEP), H. Gonzalez, Wolfgang Kowald, D. Slimmer, C. Swoboda · 1991
Each of the modules listed above must be tested before being integrated into crate subsystems as shown in Figure 1. This document details the hardware configurations required to test both individual PC and DE modules and modules assembled into crate subsystems. Detailed diagnostic test information for the FSCC, MTC, and SEQ can be found in the individual hardware and software description manuals for each module. The hardware and software description documents are listed in Table L