EFFECTIVE METHOD OF UNRELIABLE CMOS CIRCUTS IDENTIFICATION
A. I. Belous, A. V. Prybylski · DOAJ (DOAJ: Directory of Open Access Journals) · 2019
With increase of complexity factor of integrated circuits and reduction of the geometrical dimensions of integrated structures and detection of unreliable circuits still remains an actual problem. A method of rejection of potentially unreliable circuits most often used in production is imitation of operational modes at a stage of tests. However complexity and duration of realization of the specified method does it practically not suitable in the conditions of mass production of integrated circuits.