Optimization design of the RO PUF temperature reliability based on MOSFET temperature characteristics
Haojing Du, Chunsheng Guo, Shaoxiong Cui · 2025
The ring-oscillator physical unclonable function (RO PUF) is easily affected by the ambient temperature. As the temperature increases, the frequency of the ring oscillator changes, causing the ROPUF to output error response bits. We studied the temperature variation characteristics of the RO PUF relating to reliability, investigating the reasons for the low reliability of the RO PUF due to temperature effects from the perspective of MOSFET temperature characteristics, without changing the original circuit structure of the RO PUF. In the 55nm process, Cadence and Monte Carlo simulations were used to reveal how changes in MOSFET threshold voltage affect RO PUF temperature characteristics. On the above basis, a method that optimizes the temperature reliability of RO PUF circuits from MOSFET temperature characteristics was studied.