On the I/O Cost of Linear Repair Schemes for Arbitrary $(n,k)$ Reed-Solomon Codes
Wenhao Liu, Zhengyi Jiang, Zhongyi Huang, Linqi Song, Hanxu Hou · 2024
The I/O cost, i.e., the total number of symbols to be read during the single node failure/repair process in a distributed storage system, is one of the most important metrics in repairing Reed-Solomon (RS) codes by the linear repair scheme. In this paper, we construct a linear repair scheme that is applicable to arbitrary$(n,\ k)$RS codes. We show that most existing repair schemes of RS codes can be viewed as a special case of our repair scheme.