Prototype Alignment With Dedicated Experts for Test-Agnostic Long-Tailed Recognition
Chen Guo, Weiling Chen, Aiping Huang, Tiesong Zhao · IEEE Transactions on Multimedia · 2024
Unlike vanilla long-tailed recognition trains on imbalanced data but assumes a uniform test class distribution, test-agnostic long-tailed recognition aims to handle arbitrary test class distributions. Existing methods require prior knowledge of test sets for post-adjustment through multi-stage training, resulting in static decisions at the dataset-level. This pipeline overlooks instance diversity and is impractical in real situations. In this work, we introduce Prototype Alignment with Dedicated Experts (PADE), a one-stage framework for test-agnostic long-tailed recognition. PADE tackles unknown test distributions at the instance-level, without depending on test priors. It reformulates the task as a domain detection problem, dynamically adjusting the model for each instance. PADE comprises three main strategies: 1) parameter customization strategy for multi-experts skilled at different categories; 2) normalized target knowledge distillation for mutual guidance among experts while maintaining diversity; 3) re-balanced compactness learning with momentum prototypes, promoting instance alignment with the corresponding class centroid. We evaluate PADE on various long-tailed recognition benchmarks with diverse test distributions. The results verify its effectiveness in both vanilla and test-agnostic long-tailed recognition.