An Advanced Electromagnetic Interference Meter for the Twenty-First Century
Edwin L. Bronaugh · 1989
The concept of an advanced, near-real-time electromagnetic interference (EMI) meter is described. Its genesis is traced from current EMI meter technology through a "bank-of-filters” technique and a FFT/DFT analyzer to a conceptual model near-real-time EMI meter in which the Fourier transform is convoluted with desireable detector functions and indicator constraints. Such convolutions will provide for rapidly measuring the peak, quasi—peak, rms, or average of the input electromagnetic signals and noise, and also simulate special level indicator characteristics, e.g., a D'Arsonval instrument.