Special Session: Testing of Digital Computing-In Memories with MAC Function
Jin-Fu Li · 2024
Digital computing-in-memory (DCIM) with MAC function has been considered as a good alternative for the computation deep neural networks (DNNs). A basic DCIM unit with MAC function consists of a bit-multiplication memory (BMM) and an adder tree. The architecture and bit-cell structure of DCIM is very different from those of conventional SRAMs and digital CIMs with logic operations. This means that DCIM testing is more difficult than SRAM testing and different from DCIMs with logic operations. Fault models and march-like tests for SRAMs and DCIMs with logic functions are not enough for the DCIMs with MAC operation. In this embedded tutorial, therefore, we introduce the fault analysis and testing methods for DCIMs with MAC operation. Some perspectives on testing challenges of DCIMs with MAC operation are also raised.