Quantum Metrology Enhanced by Leveraging Informative Noise with Error Correction
Hongzhen Chen, Yu Chen, Jing Liu, Zibo Miao, Haidong Yuan · Physical Review Letters · 2024
The primary challenge in advancing practical quantum technology is the presence of noise, which can lead to decoherence and undermine the advantages of quantum systems. However, it is worth noting that noise can also contain information that can be harnessed to improve performance in certain quantum information tasks. This has been explored for specific types of noise, but the full potential of informative noise within general dynamics remains largely unknown. Here we demonstrate that informative noise can be transformed into a valuable resource for enhancing precision limits in quantum metrology. We provide necessary and sufficient conditions under which the precision achieved in the presence of informative noise can attain Heisenberg scaling. Our research offers a fresh perspective on the role of noise in quantum metrology and opens up avenues for achieving higher precision beyond the previously anticipated ultimate limit.