THE POSSIBILITIES OF OPTIMIZING THE OPERATING MODE OF CMOS DIGITAL INTEGRATED CIRCUITS FOR MEASURING THEIR TRANSIENT THERMAL CHARACTERISTICS
M.V. Trukhin, В. А. Сергеев, Alexey Chertoriysky · 2024
The results of measurements of the transient thermal characteristics (TTC) of CMOS digital integrated circuits (DIC) for using the voltage out low and voltage out high as temperature-sensitive parameters (TSP) are presented. Options for improving the accuracy of measuring the CMOS TTC DIC at a low supply voltage are considered.