Important factors in the design of systems containing a MEMS sensor and ASIC in relation to a variable temperature environment
Jacek Nazdrowicz, Mariusz Jankowski · 2024
The integrated capacitive analog readout circuit's characteristics are presented in this work through a static analysis for a broad range of operating temperatures. It presents and discusses a comparison of identical test-benches for multiple application-specific integrated circuits (ASICs). Die-package interconnections of the ASIC inputs were removed from a single test setup in order to expand the comparison. As a result, the package and test board have no further effect. The conducted analysis determines how temperature affects observed signal noise levels and the temperature-relation of the ASIC operating consistency. The mentioned topics include the prospective continuation of practical studies on the heat sensitivity of the ASIC functioning and the implications of the analysis offered.This paper presents extension of research on noise presents in analog ASIC devices and its influence on ADC readout digital values corresponding to capacitance of MEMS sensor. The new two additional specimens of ASIC have been tested and results have been compared to previously collected and discussed data.