Exploring Resilience of LPDRAM Against RowHammer
Anandpreet Kaur, Pravin Srivastav, Bibhas Ghoshal · IEEE Design and Test · 2024
Editor’s notes: This article investigates, for the first time, how RowHammer attacks impact LPDRAM memories. The findings reveal that RowHammer causes bit flips at specific memory locations, which facilitates more predictable attacks.—Kanad Basu, University of Texas at Dallas, USA