On the Relation Between Reliability and Entropy in Physical Unclonable Functions
Vasilii Kulagin, Sergio Vinagrero Gutiérrez, Tobias Kilian, Daniel Tille, Ulf Schlichtmann, Giorgio Di Natale, Elena Ioana Vatajelu · IEEE Design and Test · 2024
Editor’s notes: Physical unclonable functions (PUFs) represent a fundamental component of modern hardware security. Entropy and reliability are two critical metrics used to evaluate the performance of a PUF. In this article, the authors address the correlation between the two, by conducting a set of experiments using ring oscillators from Infineon. —Kanad Basu, University of Texas at Dallas, USA