EVALUATION OF STATISTICAL RESOLUTION OF ELECTRONIC COMPONENT BASE CONTROL MEANS

Владимир Крылов, В.Ш. Рахимов · Электронная техника Серия 3 Микроэлектроника · 2023

Calculation ratios and a method for rapid assessment of the statistical resolution of the means of control of the electronic component base are proposed. The technique allows you to quickly evaluate the capabilities of methods for regular and additional control of electronic components in terms of technological spread of parameters using measuring and non-measuring tools. The results of experimental approbation of the method are presented.

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