A Universal DPAT GUI Solution for Production Test
Hao Chen, Peifeng. Ni, Hua Yang · 2024
In this paper, we have addressed a universal DPAT GUI solution for ATE production test based on V93K SMT8 environment. The basic method follows closely to Automotive Electronics Council document AEC-Q001. User can set the numbers of the devices used for estimating the mean and standard deviation. Using these estimates, dynamic PAT limits for the batch are applied for further test. An embedded GUI tool helps speed up the development of production test program. With this solution, DPAT test can be precisely and easily applied to guarantee the zero-defect requirements for automotive testing with the best Time-to-Market.