Comprehensive Analysis of Read Fluctuations in ReRAM CiM by Using Fluctuation Pattern Classifier
Ayumu Yamada, Zhiyuan Huang, Naoko Misawa, Chihiro Matsui, Ken Takeuchi · IEICE Transactions on Electronics · 2024
In this work, fluctuation patterns of ReRAM current are classified automatically by proposed fluctuation pattern classifier (FPC). FPC is trained with artificially created dataset to overcome the difficulties of measured current signals, including the annotation cost and imbalanced data amount. Using FPC, fluctuation occurrence under different write conditions is analyzed for both HRS and LRS current. Based on the measurement and classification results, physical models of fluctuations are established.