Evaluating Electronic Component Testing with AI-Based Test Augmentation
Charlie Polidoro · 2024
This paper evaluates the ability of Artificial Intelligence (AI) to augment todays' proven methodologies for testing electronic components. With a combined experience of more than 10,000 sources of activity (e.g., actual tests, evaluations, collaborative projects, data sheets, user manuals, and custom test equipment), AI technology has the ability to be integrated and adopted to in order to improve electronic component testing. Due to the customization from chip to chip, there are a range of risks that need to be addressed before implementing an AI strategy for testing. As an outlook, AI enabled solutions may improve existing manual test methods and offer new test services. Further, advice is provided for a new regulatory framework to match the changing pace of new technologies such as AI.