Deep metric learning method for high resolution remote sensing image scene classification
Lihua Ye, WANG Lei, ZHANG Wenwen, Yonggang Li, WANG Zengkai · DOAJ (DOAJ: Directory of Open Access Journals) · 2019
Due to the similarity of intra-class and dissimilarity of inter-class of high-resolution remote sensing image scene, it is difficult to identify some image scene class. In this paper, a new classification approach for high-resolution remote sensing image scene is proposed based on deep learning and metric learning. Firstly, a clustering center of each class is preset on the output features of deep learning model. Secondly, the Euclidean distance method is used to calculate the average central metric loss. Finally, the final loss function consists of a central metric loss term, a cross entropy loss term, and a weight and bias term. The goal of this method is to improve the classification accuracy by forcing intra-class compactness and inter-class separability. The experimental results show that the proposed method significantly improves the classification accuracy. Compared with state-of-the-art results, the classification accuracy ratios on RSSCN7, UC Merced and NWPU-RESISC45 datasets are increased by 1.46%, 1.09% and 2.51%, respectively.