Quantum Metrology Assisted by Machine Learning
Jiahao Huang, Min Zhuang, Jungeng Zhou, Yi Shen, Chaohong Lee · Advanced Quantum Technologies · 2024
Abstract Quantum metrology aims to measure physical quantities based on fundamental quantum principles, enhancing measurement precision through resources like quantum entanglement and quantum correlations. This field holds promise for advancing quantum‐enhanced sensors, including atomic clocks and magnetometers. However, practical constraints exist in the four fundamental steps of quantum metrology, including initialization, sensing, readout, and estimation. Valuable resources, such as coherence time, impose limitations on the performance of quantum sensors. Machine learning, enabling learning and prediction without explicit knowledge, provides a powerful tool in optimizing quantum metrology with limited resources. This article reviews the fundamental principles, potential applications, and recent advancements in quantum metrology assisted by machine learning.