Redundancy Analysis Simplification Scheme for High-Speed Memory Repair
Hayoung Lee, Younwoo Yoo, Seung Ho Shin, Sungho Kang · 2023
Memory repair using redundancy analysis (RA) is widely used to improve memory yield. However, as memory fault occurrence probability has increased, simple redundancy types has been not enough to achieve a high repair rate. For this reason, memory repair using various redundancy types are seriously considered. In general, it facilitates achieving a high repair rate, but it also leads to a high increase in the RA time. To address the problem, a redundancy analysis simplification scheme is proposed in this paper. It can transform repair solution search using various redundancy types to that using simple redundancy types. Accordingly, the complexity of memory solution search can be highly reduced, and it results RA time reduction. Nevertheless, it can achieve the optimal repair rate.