Assessing the vulnerabilities of future generation IoT devices: a security testbed approach
S. Koranne, Amit Kumar Saxena, P. John · IET conference proceedings. · 2023
Future Generation Internet of Things (FGIoT) device proliferation creates unprecedented security issues while also providing disruptive opportunities across several industries. Through a Security Testbed Approach, this research paper addresses the crucial issue of addressing vulnerabilities within these cutting-edge IoT devices. Our research presents a ground-breaking methodology that is based on the creation and implementation of a comprehensive security testbed with a wide variety of Future Generation IoT devices that represent various application areas. This strategy uses a variety of methods and methodologies to cover device selection, controlled experimentation, and vulnerability assessment. The thorough study we performed revealed significant flaws in these devices, exposing possible hazards that can endanger data confidentiality, integrity, and service availability in Future Generation IoT networks. The practical ramifications of these vulnerabilities are examined, and several mitigating techniques are suggested.This study makes a substantial contribution to the field of IoT security by providing a thorough and repeatable method for evaluating vulnerabilities in Next Generation IoT Devices. The results underline how urgent it is to address security issues in this new environment and provide a strong basis for subsequent research and commercial initiatives focused at enhancing IoT ecosystem security.