Sensitivity Analysis of Manufacturing Uncertainty Errors in Superconducting Quantum Circuits
Seong Hyeon Park, Bumsung Lee, Kyungsik Seo, Seungyong Hahn · IEEE Transactions on Applied Superconductivity · 2024
To realize a practical quantum computer using superconducting qubits, engineering the superconducting quantum circuit with precise calculations of qubit energy levels and coupling strengths between components should be conducted. However, as superconducting quantum circuits scale up, identifying the discrepancy between designed and manufactured parameters becomes a major challenge. To estimate changes in key parameters due to the manufacturing errors in superconducting quantum circuits, we introduce a method for modeling manufacturing uncertainty as Gaussian random sampling and perform sensitivity analysis on selected key parameters of the circuit. Our proposed method combines circuit geometry with physics-based finite element analysis simulations to characterize the most sensitive input parameters on the key parameters. Overall, the results demonstrate that the proposed uncertainty and sensitivity analysis method can play an essential role in reducing discrepancies between the design and manufacturing processes in superconducting quantum circuits.