Biometric presentation attack detection using speckle metrology
Amit Chatterjee · 2023
Chapter 4 describes speckle metrology–based biometric PA detection strategies. When a coherent light source illuminates an optically rough surface, the scattered light creates an intensity distribution, making the surface appear to be covered with a granular structure. This structure, having alternately bright and dark spots distributed in a random way, is known as a ‘speckle’ pattern. When irradiated with speckle patterns, real and fake skin show considerably different structure. Various image processing techniques are used on the acquired data to distinguish between real and fake traits.