Innovation Test Technology for Ultra-High-Speed ADC on ATE
Yanyan Chang, Tianyu Chen, Jiaying Xiang, Yichen Xiao · 2023
Typically, traditional mix signal test theory on ATE cannot fully meet the accuracy requirement of ultra-high-speed ADC’s dynamic performance. Extra complex factors must be taken into consideration, such as chip intrinsic spur and test system introduced spur, insertion loss of ADC high-speed input signal caused by ATE load board hardware bandwidth limitation, etc. Hence, this paper presents two innovative test technologies on the ATE platform to support ultra-high-speed ADC’s accuracy test and post-calibration scenery. First, this paper presents accurate and reliable algorithms for the identification and separation of the spectrum spur of ultra-high-speed ADC, which has been verified on the ATE test platform. Secondly, this paper proposes a new de-embedding technique based on S parameter to compensate for high-speed input stimulus signal loss quickly.